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Kla Instruments
the instruments group at kla offers a large portfolio of profilometers, nanoindenters, thin film reflectometers and candela® defect inspection and metrology systems. www.kla.com/instruments kla instruments' line of optical and stylus profilers offer a complete range of surface metrology capabilities for engineering and research communities. our benchtop and automated profilers are designed to measure step height, film thickness, form, texture and automated defect inspection. we also offer high-throughput nanomechanical testers for material characterization. with flexible add-on and upgrade options, our nanoindenter systems can be used hardness, young’s modulus, adhesion and more. our affordable uv to nir spectrometer systems measure thin film thickness from 1nm to 13mm, optical constants, and deposition rates of thin films. candela® inspection and metrology systems support power device manufacturers, rf communications, led and hard-disk manufacturers with process control and in
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Distro — Free Sales Engagement Platform
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