Jordan Valley Semiconductors

jordan valley is the world leader in x-ray metrology solutions for in-line thin-films thickness, density, composition, strain & relaxation measurements on qc and product wafers with unmatched productivity. jvs portfolio include the jvx™ fast-xrr, small spot xrf, saxs and waxrd tools, and the fast hrxrd/xrr that are tool or record for strain engineering. jvs’s comprehensive x-ray metrology suite deliver advantages in speed, precision and versatility, and provides a cost-effective metrology tool for front and (feol) and back-end (beol) applications, including: sige, sic, ssoi strain control, metal gate and hi-k, copper seed/barrier, other metal systems as (al, w, ti, tin), silicides (nisi etc.), ubm and bumps. jordan valley’s tools are used by 75% of the world's top 25 semiconductor manufacturers worldwide, in production lines and for r&d.; jordan valley's tools provide a superior level of technology innovation, productivity, low cost of ownership and unmatched commitment to customer sup